Solar cell testing apparatus and solar cell testing method

ABSTRACT

A solar cell testing apparatus tests bypass diodes in a solar cell string, which is constructed of solar cell modules including solar cells and the bypass diodes, for open-position failures and includes: a unidirectional element connected between positive and negative electrodes of the solar cell string so as to permit passage of the current outputted when the solar cells generate power; a voltage applier that apples a test voltage, which exceeds a sum of forward direction voltages of the bypass diodes and sets the negative electrode potential higher than the positive electrode potential, across the positive and negative electrodes; a current detector that detects a current flowing in the solar cell string; and a processor that tests for open-position failures by comparing currents detected before and after application of the test voltage with the unidirectional element connected between the electrodes of the solar cell string.

FIELD OF THE INVENTION

The present invention relates to a solar cell testing apparatus and asolar cell testing method that execute testing of bypass diodes used insolar cells.

DESCRIPTION OF THE RELATED ART

The solar cell testing apparatus (power conditioner) disclosed inJapanese Laid-open Patent Publication No. 2011-66320 is known as oneexample of this type of solar cell testing apparatus. This solar celltesting apparatus includes: a current sensor which is connected to asolar cell array, detects the current value of a current flowing in thesolar cell array, and outputs a detection value; a voltage sensor thatdetects a voltage across both terminals of the solar cell array andoutputs a detection value; an input capacitor; an MPPT (Maximum PowerPoint Tracking) control unit that carries out MPPT control based on thedetection values of the current sensor and the voltage sensor to track apoint where the output power of the solar cell array reaches a maximum;a DC-AC invertor that converts the DC current outputted from the solarcell array to AC and outputs the AC current to a load; an AC-DCconvertor that converts an AC current from a commercial power source toa DC current; two switches for switching wiring when power is generatedand when diagnosis is performed; a CPU that carries out control over adiagnosis process for the solar cell array and the bypass diodes in thesolar cell array; and a memory that stores various information.

Here, the input capacitor functions as an input capacitor when power isgenerated, and during diagnosis, the discharging characteristics of theinput capacitor are used to acquire the I-V characteristics of the solarcell array and the I-V characteristics of the bypass diodes. The currentsensor and the voltage sensor have a function for detecting the currentand voltage used during MPPT control, and are also used during diagnosisas sensors that detect current and voltage for acquiring the I-Vcharacteristics of the solar cell array.

With this solar cell testing apparatus, during a diagnosis period thatis set in advance in a time zone period where the solar power generationsystem does not generate power, the connection between the solar cellarray and the solar cell testing apparatus (power conditioner) is cut bysetting a first switch that was connected to wiring on the powergeneration side to a neutral position and switching a second switch thatwas connected to a DC-AC invertor side to the AC-DC convertor side. TheAC current from the commercial power source is then converted by theAC-DC convertor to a DC current that charges the input capacitor. Duringcharging, in order to acquire the I-V characteristics of the bypassdiodes in particular, the input capacitor is charged so that it willdischarge in the forward direction of the bypass diodes. After chargingis complete, the second switch is set at a neutral position to cut offthe input capacitor and the AC-DC convertor.

Next, a solar cell string that includes the bypass diodes to be testedis switched from wiring on the power generation side to wiring on thediagnosis side. After this the first switch is connected to thediagnosis wiring and the input capacitor that has been charged isdischarged. The current value and voltage value during discharging areacquired from the current sensor and the voltage sensor and the I-Vcharacteristics for the solar cell string to be tested are measured fromthe current value and the voltage value that have been acquired. Here,since the current when the input capacitor is discharged is a currentthat flows in the forward direction of the bypass diodes, the I-Vcharacteristics when all of the bypass diodes included in the solar cellstring are all normal differ to the I-V characteristics when any of thebypass diodes included in the solar cell string has failed in the openposition.

With the solar cell testing apparatus described above, the I-Vcharacteristics when all of the bypass diodes are normal are stored asone type of information in the memory, and by comparing the measured I-Vcharacteristics with the normal I-V characteristics stored in thememory, it is possible to diagnose whether any of the bypass diodes hasfailed in the open position.

SUMMARY OF THE INVENTION

However, with the solar cell testing apparatus described above, there isthe following problem to be solved. That is, the solar cell testingapparatus has a problem in that it is possible to carry out diagnosisonly when the solar cells are not generating power or when the amount ofgenerated power is extremely small).

To solve the problem described above, it is a principal object of thepresent invention to provide a solar cell testing apparatus capable oftesting solar cells in a state where the solar cells are generatingpower.

To achieve the stated object, a solar cell testing apparatus accordingto the present invention tests bypass diodes in a solar cell stringconstructed by connecting a plurality of solar cell modules, whichinclude solar cells and the bypass diodes, in series for failures in theopen position; and the solar cell testing apparatus comprises aunidirectional element that is connected between a positive electrodeand a negative electrode of the solar cell string with a polarity thatpermits passage of an output current outputted from the solar cellstring when the solar cells generate power; a voltage applier capable ofapplying a test voltage, which has a voltage value that exceeds a sum offorward direction voltages of a plurality of bypass diodes and is avoltage such that a potential of the negative electrode is high relativeto a potential of the positive electrode, across the positive electrodeand the negative electrode of the solar cell string to which theunidirectional element is connected; a current detector that detects acurrent flowing in the solar cell string; and a processor that tests forfailures in the open position by comparing the currents detected by thecurrent detector before and after application of the test voltage in astate where the unidirectional element is connected between the positiveelectrode and the negative electrode of the solar cell string.

Also, the solar cell testing method to the present invention testsbypass diodes in a solar cell string constructed by connecting aplurality of solar cell modules, which include solar cells and thebypass diodes, in series for failures in the open position; and thesolar cell testing method comprises applying, in a state where aunidirectional element is connected between a positive electrode and anegative electrode of the solar cell string with a polarity that permitspassage of an output current outputted from the solar cell string whenthe solar cells generate power, a test voltage, that has a voltage valuethat exceeds a sum of forward direction voltages of a plurality of thebypass diodes and is a voltage such that a potential of the negativeelectrode is high relative to a potential of the positive electrode,across the positive electrode and the negative electrode of the solarcell string to which the unidirectional element is connected whiledetecting a current flowing in the solar cell string; and testing forfailures in the open position by comparing the current before and afterapplication of the test voltage in the state where the unidirectionalelement is connected between the positive electrode and the negativeelectrode.

With the solar cell testing apparatus and the solar cell testing methodaccording to the present invention, the presence of open failures atbypass diodes is tested by comparing the currents detected by thecurrent detecting unit before and after application of a test voltage,which has a voltage value that exceeds a sum of forward directionvoltages of a plurality of bypass diodes and is a voltage such that apotential of the negative electrode is high relative to a potential ofthe positive electrode, between the positive electrode and the negativeelectrode of solar cell string that is being shorted by theunidirectional element.

Accordingly, with the solar cell testing apparatus and the solar celltesting method according to the present invention, even when the solarcell string is generating power and the open circuit voltage isextremely high, by shorting the solar cell string using theunidirectional element, it is possible for the test voltage for turningon the plurality of bypass diodes in the solar cell string to be a lowvoltage that is only slightly higher than the sum of the forwarddirection voltages of the bypass diodes (i.e., an extremely low voltagecompared to the open-circuit voltage mentioned above). This means thatit is possible to easily and reliably test the bypass diodes forfailures in the open position, even when the solar cell string isgenerating power.

The solar cell testing apparatus according to the present invention,wherein the voltage applier includes a series circuit composed of acapacitor and a current limiting resistor; a power supply; and a switchthat switches between a charging connection state where the seriescircuit is connected to the power supply and a discharging connectionstate where the series circuit is connected between the positiveelectrode and the negative electrode of the solar cell string, and whenswitching to the charging connection state, the switch is controlled toconnect the power supply to the series circuit and the capacitor ischarged using a DC voltage outputted from the power supply, and whenswitching to the discharging connection state, the switch is controlledto connect the series circuit between the positive electrode and thenegative electrode of the solar cell string and a charging voltage ofthe capacitor that was charged in the charging connection state isapplied between the positive electrode and the negative electrode as thetest voltage.

With the solar cell testing apparatus according to the presentinvention, it is possible to easily construct the voltage applying unitof a series circuit composed of a capacitor and a current limitingresistor, a power supply (unipolar power supply), and a switch, withoutusing an expensive power supply such as a bipolar power supply. Thismeans that the solar cell testing apparatus can be manufactured at lowcost.

The solar cell testing apparatus according to the present invention,wherein the processor executes control over the voltage applier to applythe charging voltage as the test voltage while gradually increasing thecharging voltage until a upper limit voltage value set in advance isreached.

With the solar cell testing apparatus according to the presentinvention, since it is possible to gradually increase the test voltageapplied from the voltage applying unit to the solar cell string, bystopping the application of the test voltage as soon as it has beendetected that the bypass diodes are normal by comparing the currentsbefore and after application of the test voltage detected by the currentdetecting unit, for example, it is possible to prevent failure of thebypass diodes due to the application of an excessive test voltage.

It should be noted that the disclosure of the present invention relatesto the contents of Japanese Patent Application 2015-1595351 that wasfiled on May 8, 2015, the entire contents of which are hereinincorporated by reference.

BRIEF DESCRIPTION OF THE DRAWINGS

These and other objects and features of the present invention will beexplained in more detail below with reference to the attached drawings,wherein:

FIG. 1 depicts the configurations of a solar cell testing apparatus anda solar cell string;

FIG. 2 depicts the configurations of a solar cell array and a junctionbox;

FIG. 3 is a flowchart useful in explaining the operation of the solarcell testing apparatus and a solar cell testing method;

FIG. 4 is a waveform chart (a waveform chart for when the bypass diodesare normal) useful in explaining the operation of the solar cell testingapparatus and the solar cell testing method;

FIG. 5 is a waveform chart (a waveform chart for when one of the bypassdiodes has failed in the open position) useful in explaining theoperation of the solar cell testing apparatus and the solar cell testingmethod; and

FIG. 6 depicts part of the configuration of a solar cell testingapparatus in which a voltage limiting circuit is disposed.

DESCRIPTION OF THE PREFERRED EMBODIMENTS

Preferred embodiments of a solar cell testing apparatus and a solar celltesting method according to the present invention will now be describedwith reference to the attached drawings.

First, the configuration of a solar cell testing apparatus will bedescribed with reference to the drawings.

First, the configuration of a solar cell testing apparatus 1 as thesolar cell testing apparatus depicted in FIG. 1 will be described.

The solar cell testing apparatus 1 includes a unidirectional element (asexamples, a diode or a transistor connected as a diode, in the presentembodiment, a diode) 2, a voltage applying unit 3, a current detectingunit 4, a switch 5, and a processing unit 6, and tests whether bypassdiodes 24 disposed in a solar cell string 12 to be tested, describedlater, have failed in the open position.

Here, an overview of a solar cell string 12 will be given before adetailed description of the respective component elements of the solarcell testing apparatus 1. As one example, the solar cell string 12 is acomponent unit of a solar cell array 11 like that depicted in FIG. 2that is installed on a building such as an office block or a house, witha plurality of the solar cell strings 12 constructing one solar cellarray 11. As one example, a plurality of solar cell strings 12 areconnected in parallel via blocking diodes 14 in a junction box 13. Usingswitches 15 disposed inside the junction box 13, it is possible to cutoff the respective solar cell strings 12 from other solar cell strings12 or restore the solar cell strings 12 to a parallel-connected state.

As shown in FIGS. 1 and 2, each solar cell string 12 is constructed byconnecting a plurality of solar cell modules 21 in series, and eachsolar cell module 21 is constructed by connecting a plurality ofclusters 22 in series. Each cluster 22 is constructed of a plurality ofsolar cells 23 that are connected in series and a bypass diode 24 thatis connected between the output terminals of the plurality of solarcells 23 connected in series as a whole (i.e., between the outputterminals of the cluster 22). The bypass diode 24 has a cathode terminalconnected to the output terminal on the positive side of the pluralityof solar cells 23 and an anode terminal connected to the output terminalon the negative side.

With this configuration, when the state of the plurality of solar cells23 connected in series that construct a cluster 22 is such that it isdifficult for a current (DC current) to flow from the output terminal onthe negative side to the output terminal on the positive side (forexample, a state where the cells become shaded by a tree), the bypassdiode 24 allows a current inputted from another cluster 22 to pass by sothat the outputting of a current (DC current) from the solar cell string12 can continue.

Next, the respective component elements of the solar cell testingapparatus 1 will be described individually. As shown in FIG. 1, thediode 2 is connected between the positive electrode P1 and the negativeelectrode P2 of the solar cell string 12 with a polarity (polarity inthe forward direction with respect to the output current Io) thatpermits passage of the output current Io outputted from the solar cellstring 12 when the solar cells 23 are generating power. As one examplein the present embodiment, the diode 2 is connected in series with thecurrent detecting unit 4 and the switch 5, and a series circuitconstructed by such component elements is connected between the positiveelectrode P1 and the negative electrode P2 of the solar cell string 12via probes PL1, PL2, and the like. Since the current detecting unit 4that detects the output current Io has the same fundamentalconfiguration as a typical ammeter, the internal resistance will ideallybe extremely close to zero ohms. Accordingly, when the switch 5 isswitched to an ON state, the solar cell string 12 is shorted by thediode 2.

The voltage applying unit 3 is configured so as to be capable ofapplying a test voltage Vtst across the terminals of the diode 2 suchthat the cathode terminal of the diode 2 has a high potential relativeto the potential of the anode terminal. With this configuration, whenthe solar cell testing apparatus 1 is connected to the solar cell string12 and the solar cell string 12 is shorted by the diode 2 of the solarcell testing apparatus 1 (more specifically, by the series circuitcomposed of the diode 2, the current detecting unit 4, and the switch5), the voltage applying unit 3 becomes able to apply the test voltageVtst between the positive electrode P1 and the negative electrode P2 ofthe solar cell string 12 such that the negative electrode P2 has a highpotential relative to the potential of the positive electrode P1.

Also, in the present embodiment, the voltage applying unit 3 isconfigured so as to be capable of outputting the test voltage Vtst witha voltage value in at least a range from an initial voltage value Vinito an upper limit voltage value Vmax. Here, when the forward directionvoltage of the bypass diodes 24 disposed inside the various solar cellstrings 12 to be subjected to testing is expressed as “Vf” and thenumber of bypass diodes 24 in the solar cell string 12 with the lowestnumber of bypass diodes 24 out of such various solar cell strings 12 isexpressed as “n1”, the initial voltage value Vini is a voltage valuethat slightly exceeds a voltage value produced by adding a voltage dropat a current limiting resistor 32, described later, to the sum (voltage:n1×Vf) of the forward direction voltages Vf of the n1 bypass diodes 24that are connected in series. That is, the initial voltage value Vini isa voltage value likely to turn on the number n1 of bypass diodes 24 atthe same time. When the number of bypass diodes 24 in the solar cellstring 12 with the largest number of bypass diodes 24 is expressed as“n2”, the upper limit voltage value Vmax is a voltage value calculatedusing the sum (voltage value: n2×Vf) of the forward direction voltagesVf of n2 bypass diodes 24.

More specifically, as depicted in FIG. 1, as one example the voltageapplying unit 3 includes a series circuit SC composed of a capacitor 31and the current limiting resistor 32 (a resistor that limits the currentflowing during discharging of the capacitor 31 to an approximate currentvalue), a power supply (DC power supply) 33, and a pair of switches 34and 35 (single-pole, double-throw switches) as a switching unit. In thiscase, as one example, the series circuit SC is connected between the ccontacts of the switches 34 and 35, the negative electrode of the powersupply 33 is connected to the a contact of the switch 34, and thepositive electrode of the power supply 33 is connected to the a contactof the switch 35. Also, the b contact (the position that functions asthe output terminal of the voltage applying unit 3) of the switch 34 isconnected to the anode terminal of the diode 2 and the b contact (theposition that functions as the output terminal of the voltage applyingunit 3) of the switch 35 is connected to the cathode terminal of thediode 2. Note that the switches 34 and 35 can be constructed of contactswitches such as relays, or can be constructed of semiconductor switches(contactless switches) such as transistors or thyristors in order toavoid the occurrence of chattering when the switches are turned on andoff.

The power supply 33 is constructed of a variable voltage power supply(unipolar power supply), for example, and is controlled by theprocessing unit 6 to output a DC voltage V1 with a voltage value set bythe processing unit 6. The switches 34 and 35 are also controlled by theprocessing unit 6 and are selectively switched to one connection stateout of a connection state (or “charging connection state”) where the ccontacts and the a contacts are connected and a connection state (or“discharging connection state”) where the c contacts and the b contactsare connected.

With this configuration, in the voltage applying unit 3, when theswitches 34 and 35 are controlled by the processing unit 6 and areswitched to the charging connection state, the capacitor 31 thatconstructs the series circuit SC is charged by the DC voltage V1outputted from the power supply 33 to the same voltage value V1 as thevoltage value of the DC voltage V1 (such voltage value is also expressedby the symbol “V1” and referred to hereinafter as the “voltage valueV1”). When the switches 34 and 35 in this state are controlled by theprocessing unit 6 and are switched to the discharging connection state,the voltage applying unit 3 applies the DC voltage V1 that stored in thecapacitor 31 across the diode 2 (that is, across the solar cell string12 that is shorted by the diode 2 when the switch 5 is in the on state)as the test voltage Vtst with the polarity described above. Note thatsince it is sufficient to supply enough power to charge the capacitor 31as described above, the power supply 33 may be simply configured of acombination of a battery and the step-up circuit.

As described above, the current detecting unit 4 is connected, via theprobes PL1 and PL2, between the positive electrode P1 and the negativeelectrode P2 of the solar cell string 12 in a state where the diode 2and the switch 5 are connected in series. The current detecting unit 4includes a current-to-voltage converting circuit, for example, detects apassing current and converts the current to the voltage and outputs theconverted voltage to the processing unit 6 as a voltage signal Si (asignal whose voltage value changes in proportion to the current value ofthe passing current).

As one example, the switch 5 is constructed of a semiconductor switch(contactless switch), such as a transistor or a thyristor, to avoidarcing when the switch is turned on and off. According to control by theprocessing unit 6, the switch 5 is selectively switched to one state outof an on state and an of state. As described above, the switch 5 isconnected, via the probes PL1 and PL2, between the positive electrode P1and the negative electrode P2 of the solar cell string 12 in a statewhere the diode 2 and current detecting unit 4 are connected in series.

As one example, the processing unit 6 includes an A/D converter, amemory, a CPU, and the like, and is configured so as to be capable ofexecuting control processes over the voltage applying unit 3 (morespecifically, a process that sets the voltage value V1 of the DC voltageV1 of the power supply 33, a process that controls the starting andstopping of output of the DC voltage V1, and a process that switches theswitches 34 and 33), a waveform measuring process that measures acurrent waveform of the current flowing in the current detecting unit 4based on the voltage signal Si outputted from the current detecting unit4, a control process for the switch 5 (a process that switches theswitch 5), and a bypass diode testing process 50 (see FIG. 3) that teststhe bypass diodes 24 of the solar cell string 12 connected as the testedobject via the probes PL1 and PL2 to the solar cell testing apparatus 1(a process that tests for the presence of bypass diodes 24 that havefailed in the open position). Note that the initial voltage value Vinidescribed above, the upper limit voltage value Vmax described above, andan increment (a unit voltage ΔV) used when gradually increasing thevoltage value V1 of the DC voltage V1 (as one example in the presentembodiment, the values is increased in steps) are stored in advance inthe memory of the processing unit 6.

Also, the processing unit 6 is configured so as to be capable ofexecuting an output process that outputs the result of the bypass diodetesting process 50. For this output process, the solar cell testingapparatus 1 is provided with an output apparatus such as a displayapparatus, and it is possible to output the result of the test to suchoutput apparatus and/or to output the result of the test to anotherapparatus provided outside the solar cell testing apparatus 1.

Next, the operation of the solar cell testing apparatus 1 when testingthe bypass diodes 24 of a solar cell string 12 using the solar celltesting apparatus 1, and a solar cell testing method will be describedwith reference to FIG. 3. Note that it is assumed that the respectivesolar cells 23 of the solar cell string 12 are normal.

When testing the bypass diodes 24 of a plurality of solar cell strings12 that construct a solar cell array 11 installed on a building, anoperation where a solar cell string 12 that is to be connected as atested object to the solar cell testing apparatus 1 is cut off from theother solar cell strings 12 by switching a switch 15, out of theswitches 15 in the junction box 13 connected to the solar cell array 11,corresponding to such solar cell string 12 from the on state to the offstate, and the solar cell testing apparatus 1 is then connected via theprobes PL1 and PL2 between the positive electrode P1 and the negativeelectrode P2 of such solar cell string 12 in the cut-off state isrepeatedly carried out until the testing of the bypass diodes 24 of allof the solar cell strings 12 has been completed.

With the solar cell testing apparatus 1, the bypass diode testingprocess 50 depicted in FIG. 3 is executed in a state where the solarcell string 12 (i.e., the solar cell string 12 including the bypassdiodes 24 to be tested) to be tested is connected via the probes PL1 andPL2.

In the bypass diode testing process 50, the processing unit 6 firstexecutes a process that shorts the solar cell string 12 (step 51). Inthis process, the processing unit 6 executes a control process over theswitch 5 to switch the switch 5 that is off in an initial state to theon state. By doing so, the switch 5 in the on state and the currentdetecting unit 4 that is in a state where the internal resistance isextremely close to zero ohms, as well as the diode 2 with a polaritythat permits passage of the output current Io from the solar cell string12, become connected in series between the positive electrode P1 and thenegative electrode P2 of the solar cell string 12 via the probes PL1 andPL2. This means that the solar cell string 12 is shorted by the seriescircuit composed of the diode 2, the current detecting unit 4, and theswitch 5.

Next, the processing unit 6 executes a process that measures the outputcurrent Io outputted from the solar cell string 12 in the shorted state(since this is the output current Io in the shorted state, this currentis also referred to as the “shorted current Is”) (step 52). Morespecifically, in this process, the processing unit 6 first executes awaveform measuring process that measures and stores the current waveform(see FIG. 4) of the shorted current Is flowing in the current detectingunit 4 based on the voltage signal Si outputted from the currentdetecting unit 4. Next, the processing unit 6 measures the current valueof the shorted current Is based on the stored current waveform andstores a current value that is slightly higher than the measured currentvalue (for example, a current value that is several percent higher) as acurrent threshold Ith (see FIG. 4) used when testing the bypass diodes24. Here, in a period that is sufficiently shorter than the timerequired for the insolation on the solar cell string 12 to change, suchas the time required by one iteration of the bypass diode testingprocess 50 (since it is effectively enough to observe the dischargewaveform of the capacitor 31, several milliseconds to several tens ofmilliseconds including the time required to measure the shorted currentIs), it is possible to regard the insolation on the solar cell array 11as substantially constant. This means that the shorted current Is has acurrent waveform of a DC current with a substantially constant currentvalue, as shown by the solid line in FIG. 4.

Note that whenever the bypass diode testing process 50 is executed, byusing a configuration that measures and stores the current thresholdIth, it is possible to adjust (i.e., increase or decrease) the currentthreshold Ith in keeping with changes in insolation on the solar cellarray 11 (that is, the amount of sunshine on the solar cell string 12),which means that it is possible to improve the precision of the testingof the bypass diodes 24 that uses this current threshold Ith asdescribed later.

Next, the processing unit 6 executes a control process over the voltageapplying unit 3 and sets the voltage value V1 of the DC voltage V1outputted from the power supply 33 at the initial voltage value Vini(step 53).

Next, the processing unit 6 executes a control process over the voltageapplying unit 3 to charge the capacitor 31 to the DC voltage V1 (step54). More specifically, in step 54, the processing unit 6 first executesa process that switches the switches 34 and 35 to connect the seriescircuit SC composed of the capacitor 31 and the current limitingresistor 32 to the power supply 33 and then has the power supply 33start outputting the DC voltage V1. By doing so, the capacitor 31 ischarged to the DC voltage V1 (i.e., to a state where the switch 35 sideterminal reaches a potential that is the voltage value V1 higher thanthe potential of the switch 34 side terminal).

Next, the processing unit 6 executes a control process over the voltageapplying unit 3, connects the capacitor 31 to the diode 2, has thecapacitor 31 discharged, and measures the maximum current value (peakvalue) Ip of the current flowing in the current detecting unit 4 duringdischarging of the capacitor 31 (step 55). More specifically, in step55, the processing unit 6 executes a process that switches the switches34 and 35 and connects the series circuit SC composed of the capacitor31 and the current limiting resistor 32 to the diode 2. By doing so, theDC voltage V1 stored in the capacitor 31 is applied to the diode 2 in astate where the potential of the cathode terminal is at a high potentialcompared to the potential of the anode terminal and in turn is appliedas the test voltage Vtst to the solar cell string 12 that is shorted bythe diode 2. After applying the test voltage Vtst, the processing unit 6executes a control process over the voltage applying unit 3 to stop thepower supply 33 outputting the DC voltage V1.

The processing unit 6 executes the waveform measuring process for a timeset in advance from the start of application of the test voltage Vtst,measures the current waveform of the current flowing in the currentdetecting unit 4 based on the voltage signal Si outputted from thecurrent detecting unit 4, and measures and stores the maximum currentvalue (peak value) Ip of the current flowing in the current detectingunit 4 based on such current waveform.

After this, the processing unit 6 compares the measured peak value Ipwith the current threshold Ith stored in step 52 (step 56).

Here, as depicted in FIG. 1, the test voltage Vtst is applied to everybypass diode 24 in the plurality of bypass diodes 24 in the solar cellstring 12 with polarity such that the anode terminal becomes a nighpotential relative to the cathode terminal (i.e., the voltage is appliedin the forward direction). This means that when the test voltage Vtsthas a voltage value that exceeds the sum of the forward directionvoltage values Vf of the plurality of the bypass diodes 24 in the solarcell string 12 being tested (first condition) and when all of the bypassdiodes 24 are normal (second condition), all of the bypass diodes 24 areturned on by the application of the test voltage Vtst.

Accordingly, when doing so, the charge applied to the capacitor 31 flowson a current path from the voltage applying unit 3 that reaches thevoltage applying unit 3 via the negative electrode P2 of the solar cellstring 12, the bypass diodes 24 in the on state that are connected inseries in the solar cell string 12, the positive electrode P1 of thesolar cell string 12, the switch 5 in the on state, and a currentdetecting unit 42, so that for a period immediately after application ofthe test voltage Vtst, as depicted in FIG. 4, a peak that exceeds thecurrent waveform of the shorted current Is appears in the currentwaveform of the current flowing in the current detecting unit 4. Also,as described above, by setting the current threshold Ith at a currentvalue that is slightly higher than the current value of the shortedcurrent Is, in most cases the peak value Ip of the peak will exceed thecurrent threshold Ith.

On detecting, as a result of the comparison in step 56, a state wherethe peak value Ip that exceeds the current threshold Ith, the processingunit 6 determines that all of the bypass diodes 24 in the solar cellstring 12 being tested are normal, executes the output process, andoutputs a test result showing that the bypass diodes 24 are normal (step57). Note that when, as a result of the stored charge being discharged,the voltage of the capacitor 31 falls to the sum of the forwarddirection voltage values Vf of the bypass diodes 24 or below, all of thebypass diodes 24 return from the or state to the off state, which meansthat as shown in FIG. 4, the current flowing in the current detectingunit 4 returns to the shorted current Is from the solar cell string 12.In such case, the charge remaining in the capacitor 31 flows as part ofthe shorted current Is (i.e., the discharging of the capacitor 31continues) and the voltage of the capacitor 31 gradually decreases andreaches substantially zero volts (more specifically, the forwarddirection voltage of the diode 2).

After executing step 57, the processing unit 6 executes a controlprocess over the switch 5 to switch the switch 5 to the off state (i.e.,the initial state). By doing so, the shorting of the solar cell string12 by the series circuit composed of the diode 2, the current detectingunit 4, and the switch 5 is removed (step 58) and the bypass diodetesting process 50 is completed.

On the other hand, when, as the result of the comparison in step 56, itis detected that the peak value Ip is equal to or below the currentthreshold Ith (in reality, since it is not possible to observe peaksthat are smaller than the shorted current Is, when a shorted current Isin which no peak appear has been observed), the processing unit 6determines that the first condition described above is not satisfied,that is, the test voltage Vtst has not reached the sum of the forwarddirection voltage values Vf of the plurality of bypass diodes 24 in thesolar cell string 12, and calculates, as a new candidate voltage valueV1 for the DC voltage V1, a voltage value obtained by adding the unitvoltage ΔV stored in the memory to the present voltage value V1 (step59). Not that in this case, as depicted in FIG. 5, since the currentproduced due to the discharging of the capacitor 31 depicted by thebroken line flows as part of the shorted current Is, during thedischarging state of the capacitor 31 also, the current detected by thecurrent detecting unit 4 is the shorted current Is from the solar cellstring 12 only. The capacitor 31 also continues to discharge, and thevoltage gradually decreases and reaches substantially zero volts (morespecifically, the forward direction voltage of the diode 2).

In this way, when a new higher voltage value V1 has been calculated, theprocessing unit 6 compares the new voltage value V1 and the upper limitvoltage value Vmax stored in the memory and determines whether thevoltage value V1 exceeds the upper limit voltage value Vmax (step 60).When, as a result, the voltage value V1 does not exceed the upper limitvoltage value Vmax (when V1>Vmax is not satisfied), the processing unit6 proceeds to step 54 described above and by executing the controlprocess over the voltage applying unit 3, the capacitor 31 is charged bythe DC voltage V1 with the new voltage value V1.

After this, while repeatedly executing step 54, step 55, step 56, step59, and step 60, if the result of the comparison in step 56 is that “thepeak value Ip exceeds the current threshold Ith” before the new voltagevalue V1 calculated in step 59 exceeds the upper limit voltage valueVmax in the comparison in step 60, the processing unit 6 determines thatall of the bypass diodes 24 in the solar cell string 12 being tested arenormal and outputs such test result (step 57), removes the shorting ofthe solar cell string 12 (step 58), and completes the bypass diodetesting process 50.

On the other hand, if, during the repeated execution of step 54, step55, step 56, step 59, and step 60, the processing unit 6 detects thatthe new voltage value V1 calculated in step 59 has exceeded the upperlimit voltage value Vmax in the comparison in step 60 before the resultof the comparison in step 56 is that “the peak value Ip exceeds thecurrent threshold Ith”, the processing unit 6 determines that at leastone bypass diode 24 in the solar cell string 12 being tested has failedin the open position and executes the output process to output a testresult indicating such result (step 61).

The reason for determining that there is a failure in the open positionis as follows. Irrespective of the first condition described above beingsatisfied (that is, when, even for the solar cell string 12 with thelargest (n2) number of bypass diodes 24 out of the solar cell strings 12to be tested, the upper limit voltage value Vmax exceeds the sum (n2×Vf)of the forward direction voltage Vf of such bypass diodes 24), thebypass diodes 24 do not enter the on state because the second conditiondescribed above (that is, the condition that all the bypass diodes 24are normal) is not satisfied, that is, at least one of the bypass diodes24 in the solar cell string 12 being tested has failed in the openposition. In this case, the charge of the capacitor 31 flows as part ofthe shorted current Is and the voltage of the capacitor 31 graduallyfalls and reaches substantially zero volts (more specifically, theforward direction voltage of the diode 2).

After executing step 61, the processing unit 6 executes control over theswitch 5 and switches the switch 5 to the off state (i.e., the initialstate). By doing so, the shorting of the solar cell string 12 by theseries circuit composed of the diode 2, the current detecting unit 4,and the switch 5 is removed (step 58) and the bypass diode testingprocess 50 is completed.

In this way, with the solar cell testing apparatus 1 and the solar celltesting method described above, when testing the bypass diodes 24 in asolar cell string 12 for failures in the open position, in a state wherethe diode 2 is connected between the positive electrode P1 and thenegative electrode P2 of the solar cell string 12 with polarity thatpermits the passage of the output current Io outputted from the solarcell string 12 when the solar cells 23 are generating power, a testvoltage Vtst with the voltage value V1 that exceeds the sum of theforward direction voltages Vf of the plurality of bypass diodes 24 andis such that the potential of the negative electrode P2 is higher thanthe potential of the positive electrode P1 is applied between thepositive electrode P1 and the negative electrode P2 of the solar cellstring 12 to which the diode 2 is connected (i.e., the solar cell string12 that is shorted by the connected diode 2), and a test for failures inthe open position is performed for the bypass diodes 24 by comparing thecurrents detected by the current detecting unit 4 before and afterapplication of the test voltage Vtst (in the example described above, bycomparing the current threshold Ith decided based on the shorted currentIs before application of the test voltage Vtst and the peak value Ip ofthe current after application of the test voltage Vtst).

Accordingly, according to the solar cell testing apparatus 1 and thesolar cell testing method described above, even when the solar cellstring 12 (that is, the solar cells 23) are generating power and theopen-circuit voltage is extremely high (as one example, around 1000V forthe largest solar cell strings 12, where the number of solar cellmodules 21 connected in series is 30 and three clusters 22 are connectedin series in each solar cell module 21), by shorting the diode 2, it issufficient for the test voltage Vtst for turning on the plurality ofbypass diodes 24 in a solar cell string 12 to be a low voltage that isonly slightly higher than the sum of the forward direction voltages Vfof the bypass diodes 24 (in the example described above, the number ofbypass diodes 24 in one solar cell string 12 is 90 (=30×3), and if theforward direction voltage Vf is 0.6V, for example, the sum will be 54V,which is an extremely low voltage compared to 1000V). This means that itis possible to easily and reliably test bypass diodes for failures inthe open position, even when a solar cell string is generating power.

Also, according to the solar cell testing apparatus 1 and the solar celltesting method described above, it is possible, as in the exampledescribed above, to produce the voltage applying unit 3 of the seriescircuit SC with a simple configuration composed of the capacitor 31 andthe current limiting resistor 32, the power supply 33, and the pair ofswitches 34 and 35 (single-pole, double-throw switches) as a switchingunit, without using an expensive power supply such as a bipolar powersupply. This means that the solar cell testing apparatus 1 can bemanufactured at low cost.

Also, with the solar cell testing apparatus 1 and the solar cell testingmethod described above, the processing unit 6 executes control over thevoltage applying unit 3 to gradually increase the charging voltage(voltage value V1) of the capacitor 31 while applying such voltage asthe test voltage Vtst until the charging voltage reaches the upper limitvoltage value Vmax set in advance. As described above, the number ofbypass diodes 24 provided in a solar cell string 12 being tested maydiffer depending on the solar cell array 11 installed on a building.Here, although it would be conceivable to use a configuration where theupper limit voltage value Vmax, which is capable of turning on thebypass diodes 24 in a solar cell string 12 with the highest number ofbypass diodes 24 out of the solar cell strings 12 to be tested, isapplied from the start as the test voltage Vtst, with such aconfiguration, an excessive test voltage Vtst would be applied to asolar cell string 12 with a low number of bypass diodes 24, for example,and due to this an overcurrent would flow to the bypass diodes 24, whichcould cause one or more bypass diodes 24 to fail.

On the other hand, according to the solar cell testing apparatus 1 andthe solar cell testing method described above, since it is possible togradually increase the test voltage Vtst applied from the voltageapplying unit 3 to the solar cell string 12, by stopping the applicationof the test voltage Vtst as soon as it has been detected that the bypassdiodes 24 are normal by comparing the currents before and afterapplication of the test voltage Vtst detected by the current detectingunit 4, it is possible to prevent failure of the bypass diodes 24 due tothe application of an excessive test voltage Vtst.

Note that it should be obvious that when testing a solar cell string 12for which the number of internally-provided bypass diodes 24 is known,in place of a configuration that gradually increases the test voltageVtst applied to the solar cell string 12, it is possible to use aconfiguration that applies a test voltage Vtst calculated from the sumof the forward direction voltages Vf of such bypass diodes 24 from thestart.

Also, as depicted in FIG. 6, it is also possible to use a configurationwhere a voltage limiting circuit 7, which limits the upper limit of thecurrent flowing in the bypass diodes 24 due to the application of thetest voltage Vtst to a limit value, is disposed in the current circuit.Note although FIG. 6 depicts a configuration where the voltage limitingcircuit 7 is disposed outside the voltage applying unit 3, it is alsopossible to use a configuration where the voltage limiting circuit 7 isdisposed inside the voltage applying unit 3. When the voltage limitingcircuit 7 is provided, by setting the limit value of the voltagelimiting circuit 7 below the peak forward current of the bypass diodes24, it is possible, even when a variety of solar cell strings 12 withdifferent numbers of bypass diodes 24 are tested, to use a configurationwhere the upper limit voltage Vmax that is capable of turning on thebypass diodes 24 in the solar cell string 12 with the highest number ofbypass diodes 24 out of the solar cell strings 12 to be tested isapplied from the start as the test voltage Vtst while still avoidingfailure of the bypass diodes 24 due to an overcurrent. Although detailedinformation on the bypass diodes used in solar cell modules is typicallynot released by module makers and it is difficult to know the peakforward current, by considering the purpose of bypass diodes which is toenable a generated current to bypass failed clusters and continueflowing, the shorted current indicated in the specification of a solarcell module will definitely be able to flow in such module. For thisreason, it is desirable to limit the limit value of the voltage limitingcircuit 7 to double the shorted current Is observed in step 52 (i.e.,the shorted current Is plus the current flowing in the bypass diodes)(this refers to the voltage limiting circuit 7 being controlled by theprocessing unit 6). In this case, the current limiting resistor 32 thatconstructs the series circuit SC of the voltage applying unit 3 depictedin FIG. 1 is not needed during discharging. On the other hand, when thecapacitor 31 is being charged by the power supply 33, it is necessary tolimit the charging current. Accordingly, a configuration is used wherein place of the location depicted in FIG. 1, the current limitingresistor 32 is disposed at at least one of a location between the powersupply 33 and the switch 34 as depicted in FIG. 6 and a location betweenthe power supply 33 and the switch 35 (not illustrated). With thisconfiguration, it is possible to test for bypass diodes 24 that havecalled in the open position by a single application of the test voltageVtst, which makes it possible to reduce the time required for testing.

Also, as described above, when testing the bypass diodes 24 of aplurality of solar cell strings 12 that construct a single solar cellarray 11 installed on a building, an operation where one solar cellstring 12 to be tested is cut off from the other solar cell strings 12and connected to the solar cell testing apparatus 1 is executed forevery solar cell string 12. This means that with the solar cell testingapparatus 1 and the solar cell testing method described above, it ispossible to acquire current waveforms when the test voltage Vtst isapplied to each solar cell string 12. Accordingly, it is also possibleto detect a change in impedance (or extent of deterioration) of thebypass diodes 24 by comparing the peak value Ip of the current flowingin the bypass diodes 24 of a solar cell string 12 that is normal withother solar cell strings 12.

Also, in the example described above, although a configuration where thecurrent threshold Ith decided based on the shorted current Is beforeapplication of the test voltage Vtst is compared with the peak value Ipof the current after application of the test voltage Vtst is used as oneexample of a configuration that compares the currents detected by thecurrent detecting unit 4 before and after application of the testvoltage Vtst, it is also possible to use a configuration that comparesthe waveforms of the currents detected by the current detecting unit 4before and after application of the test voltage Vtst while focusing onthe appearance of a spiked (peaked) waveform in the waveform of thecurrent detected by the current detecting unit 4 as depicted in FIG. 4when all of the bypass diodes 24 are normal and the absence of suchspiked (peaked) waveform when one of the bypass diodes 24 has failed inthe open position as depicted in FIG. 5.

The location of the current detecting unit 4 is not limited to thelocation depicted in FIG. 1. The current detecting unit 4 may bedisposed at an arbitrary position on a current path (a current path thatreaches the negative electrode P2 of the solar cell string 12 from thepositive electrode P1 via the switch 5 and the voltage applying unit 3)of the spiked current that flows when the bypass diodes 24 are turned ondue to the application of the test voltage Vtst. Accordingly, it ispossible to dispose the current detecting unit 4 on the side of thevoltage applying unit 3 connected to both ends of the diode 2. Morespecifically, it is possible to dispose the current detecting unit 4 atone location out of a location between the b contact of the switch 34and the anode terminal of the diode 2 and a location between the bcontact of the switch 35 of the cathode terminal of the diode 2. Inaddition, it is possible to dispose the current detecting unit 4 inseries with the series circuit SC inside the voltage applying unit 3(i.e., it is possible to integrate the current detecting unit 4 in thevoltage applying unit 3).

Also, as described above, although the solar cell string 12 is typicallyconstructed by connecting a plurality of solar cell modules 21 inseries, for a solar cell array 11 constructed of a solar cell module 21with a single solar cell string 12, the solar cell string 12 to betested will be the solar cell module 21 itself.

What is claimed is:
 1. A solar cell testing apparatus that tests bypassdiodes in a solar cell string constructed by connecting a plurality ofsolar cell modules, which include solar cells and the bypass diodes, inseries for failures in the open position, the solar cell testingapparatus comprising: a unidirectional element that is connected betweena positive electrode and a negative electrode of the solar cell stringwith a polarity that permits passage of an output current outputted fromthe solar cell string when the solar cells generate power; a voltageapplier capable of applying a test voltage, which has a voltage valuethat exceeds a sum of forward direction voltages of a plurality ofbypass diodes and is a voltage such that a potential of the negativeelectrode is high relative to a potential of the positive electrode,across the positive electrode and the negative electrode of the solarcell string to which the unidirectional element is connected; a currentdetector that detects a current flowing in the solar cell string; and aprocessor that tests for failures in the open position by comparing thecurrents detected by the current detector before and after applicationof the test voltage in a state where the unidirectional element isconnected between the positive electrode and the negative electrode ofthe solar cell string.
 2. The solar cell testing apparatus according toclaim 1, wherein the voltage applier includes: a series circuit composedof a capacitor and a current limiting resistor; a power supply; and aswitch that switches between a charging connection state where theseries circuit is connected to the power supply and a dischargingconnection state where the series circuit is connected between thepositive electrode and the negative electrode of the solar cell string,and when switching to the charging connection state, the switch iscontrolled to connect the power supply to the series circuit and thecapacitor is charged using a DC voltage outputted from the power supply,and when switching to the discharging connection state, the switch iscontrolled to connect the series circuit between the positive electrodeand the negative electrode of the solar cell string and a chargingvoltage of the capacitor that was charged in the charging connectionstate is applied between the positive electrode and the negativeelectrode as the test voltage.
 3. The solar cell testing apparatusaccording to claim 2, wherein the processor executes control over thevoltage applier to apply the charging voltage as the test voltage whilegradually increasing the charging voltage until a upper limit voltagevalue set in advance is reached.
 4. A solar cell testing method thattests bypass diodes in a solar cell string constructed by connecting aplurality of solar cell modules, which include solar cells and thebypass diodes, in series for failures in the open position, the solarcell testing method comprising: applying, in a state where aunidirectional element is connected between a positive electrode and anegative electrode of the solar cell string with a polarity that permitspassage of an output current outputted from the solar cell string whenthe solar cells generate power, a test voltage, that has a voltage valuethat exceeds a sum of forward direction voltages of a plurality of thebypass diodes and is a voltage such that a potential of the negativeelectrode is high relative to a potential of the positive electrode,across the positive electrode and the negative electrode of the solarcell string to which the unidirectional element is connected whiledetecting a current flowing in the solar cell string; and testing forfailures in the open position by comparing the current before and afterapplication of the test voltage in the state where the unidirectionalelement is connected between the positive electrode and the negativeelectrode.